关键词:
Temperature measurement
Silicon carbide
MOSFET
Temperature sensors
Sensitivity
Threshold voltage
Logic gates
Accuracy
Circuits
Voltage measurement
Junction temperature sensing
power conversion
power semiconductor
reliability
silicon carbide (SiC) metal oxide semiconductor field effect transistor (MOSFET)
摘要:
Accurate online junction temperature (T-j) extraction is crucial to power mosfets' reliability and health management. However, most temperature-sensitive electrical parameters in silicon carbide (SiC) power mosfets exhibit relatively low temperature sensitivity, which limits extracting accuracy and increases the bandwidth requirements of measurement circuits. To address these challenges, this article proposes a high-sensitive online (T-j) extracting method, called linear-mode current response (LMCR). A theoretical formula is proposed for the first time to reveal the electrothermal characteristics of the drain current in linear mode. Then, technology computer aided design (TCAD) simulations and experimental results verify its high sensitivity to (T-j) and controllability. To apply for (T-j) extraction, this article details the implementation of the LMCR-based (T-j) extracting unit and strategy. By injecting a narrow current pulse into the device, the (T-j) can be determined from the LMCR. Calibrations using double pulse test are introduced and demonstrate the method's advantages, including high (T-j) sensitivity, spontaneous injection, minimal additional losses, and low dependence on load current and bus voltage. Finally, the effectiveness of the proposed method is further validated through experiments with a SiC power boost converter. The results show that narrow pulse injection does not affect the load or other components, and this method provides high measurement sensitivity, low invasive interference, and eliminates the need for high-bandwidth circuits.